With the down-scaling of CMOS technology, the design complexity of very large-scale
integrated is increasing. Although the application of machine learning (ML) techniques in …

Due to the increasing size of integrated circuits (ICs), their design and optimization phases
(ie, computer-aided design, CAD) grow increasingly complex. At design time, a large design …

Lithographic hotspot detection is crucial for ensuring manufacturability and yield in
advanced integrated circuit (IC) designs. While machine learning approaches have shown …

As the circuit feature size continuously shrinks down, hotspot detection has become a more
challenging problem in modern DFM flows. Developed deep learning techniques have …

With the aggressive and amazing scaling of the feature size of semiconductors, hotspot
detection has become a crucial and challenging problem in the generation of optimized …

An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

Extensive technology scaling has not only increased the complexity of Integrated Circuit (IC)
fabrication but also multiplied the challenges in the Design For Manufacturability (DFM) …

The technology of big data analysis and artificial intelligence deep learning has been
actively cross-combined with various fields to increase the effect of its original low single …

There is substantial interest in the use of machine learning (ML)-based techniques
throughout the electronic computer-aided design (CAD) flow, particularly those based on …

Machine learning (ML) provides state-of-the-art performance in many parts of computer-
aided design (CAD) flows. However, deep neural networks (DNNs) are susceptible to …