Silicon nitride and hydrogenated silicon nitride thin films: A review of fabrication methods and applications

N Hegedüs, K Balázsi, C Balázsi - Materials, 2021 - mdpi.com
Silicon nitride (SiNx) and hydrogenated silicon nitride (SiNx: H) thin films enjoy widespread
scientific interest across multiple application fields. Exceptional combination of optical …

Improvement of Instability in Normally-Off GaN MIS-HEMTs Employing as an Interfacial Layer

W Choi, H Ryu, N Jeon, M Lee… - IEEE Electron Device …, 2013 - ieeexplore.ieee.org
In this letter, reduction of threshold voltage instability in gate recessed normally-off GaN
metal insulator semiconductor high electron mobility transistors with SiN x gate insulator was …

Kelvin probe force gradient microscopy of charge dissipation in nano thin dielectric layers

MS Dunaevskiy, PA Alekseev, P Girard… - Journal of Applied …, 2011 - pubs.aip.org
Application of Kelvin probe force gradient microscopy (KPFGM) to visualize the local charge
dissipation in thin dielectric layers is considered. By this method, the local charge behavior …

Study of the impact of interface traps associated with SiN X passivation on AlGaN/GaN MIS-HEMTs

R Baby, A Venugopalrao… - Semiconductor …, 2022 - iopscience.iop.org
In this work, we show that a bilayer SiN x passivation scheme which includes a high-
temperature annealed SiN x as gate dielectric, significantly improves both ON and OFF state …

Negatively charged silicon nitride films for improved p-type silicon surface passivation by low-temperature rapid thermal annealing

P Wang, S **, T Lu, C Cui, D Yang… - Journal of Physics D …, 2019 - iopscience.iop.org
The effect of post-deposition rapid thermal annealing (RTA) on p-type Czochralski silicon
surface passivation by plasma-enhanced chemical vapor deposited nitrogen-rich silicon …

Polaron formation in the hydrogenated amorphous silicon nitride

C Wilhelmer, D Waldhör, L Cvitkovich, D Milardovich… - Physical Review B, 2024 - APS
Silicon nitride (Si 3 N 4) is commonly used as the charge storage layer of nonvolatile charge
trap flash (CTF) memory devices. Previous theoretical investigations have shown a large …

[BUCH][B] Study of charges present in silicon nitride thin films and their effect on silicon solar cell efficiencies

V Sharma - 2013 - search.proquest.com
As crystalline silicon solar cells continue to get thinner, the recombination of carriers at the
surfaces of the cell plays an ever-important role in controlling the cell efficiency. One tool to …

On the surface passivation of textured C-Si by PECVD silicon nitride

Y Wan, KR McIntosh - IEEE Journal of Photovoltaics, 2013 - ieeexplore.ieee.org
We investigate the surface passivation of crystalline silicon (c-Si) wafers that are textured
with random upright pyramids and passivated with amorphous silicon nitride (SiN _x). Over …

Effective Antireflection and Surface Passivation of Silicon Using a SiO2/aT iOx Film Stack

RS Bonilla, KO Davis, EJ Schneller… - IEEE Journal of …, 2017 - ieeexplore.ieee.org
This paper reports an effective and industrially relevant passivation and antireflection film
stack featuring a 10 nm silicon dioxide (SiO 2) film followed by a≈ 65 nm amorphous …

Enhanced red emission from amorphous silicon carbide films via nitrogen do**

G Chen, S Chen, Z Lin, R Huang, Y Guo - Micromachines, 2022 - mdpi.com
The enhanced red photoluminescence (PL) from Si-rich amorphous silicon carbide (a-SiCx)
films was analyzed in this study using nitrogen do**. The increase in nitrogen do** …