Catastrophic failure and fault-tolerant design of IGBT power electronic converters-an overview

R Wu, F Blaabjerg, H Wang, M Liserre… - IECON 2013-39th …, 2013 - ieeexplore.ieee.org
Reliability is one of the key issues for the application of Insulated Gate Bipolar Transistors
(IGBTs) in power electronic converters. Many efforts have been devoted to the reduction of …

Multiphysics Coupling in IGBT Modules: A Review

W Tian, N Chen - Journal of Electronic Packaging, 2024 - asmedigitalcollection.asme.org
Since insulated gate bipolar transistor (IGBT) is a core component for power conversion in a
power electronic system, guaranteeing the safety of IGBT becomes a crucial task for the …

PSpice-COMSOL-based 3-D electrothermal–mechanical modeling of IGBT power module

Y Jia, F **ao, Y Duan, Y Luo, B Liu… - IEEE Journal of …, 2019 - ieeexplore.ieee.org
The behavior of the insulated gate bipolar transistor (IGBT) module results in the electric
field, temperature field, and stress field, and there are strong coupling effects among its …

Modeling of IGBT resistive and inductive turn-on behavior

AT Bryant, L Lu, E Santi, JL Hudgins… - IEEE Transactions on …, 2008 - ieeexplore.ieee.org
Although insulated-gate bipolar-transistor (IGBT) turn-on losses can be comparable to turn-
off losses, IGBT turn-on has not been as thoroughly studied in the literature. In the present …

Chip-level electrothermal stress calculation method of high-power IGBT modules in system-level simulation

J Wang, W Chen, Y Wu, J Zhang… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Although with good robustness, insulated gate bipolar transistor (IGBT) modules suffer from
catastrophic failures due to excessive electrothermal stress in field use. In view of the …

Comprehensive investigation on current imbalance among parallel chips inside MW-scale IGBT power modules

R Wu, L Smirnova, H Wang, F Iannuzzo… - 2015 9th International …, 2015 - ieeexplore.ieee.org
With the demands for increasing the power rating and improving reliability level of the high
power IGBT modules, there are further needs of understanding how to achieve stable …

A lumped-charge approach based physical SPICE-model for high power soft-punch through IGBT

Y Duan, F **ao, Y Luo… - IEEE Journal of Emerging …, 2018 - ieeexplore.ieee.org
This paper presents a new lumped-charge approach-based physical model for high power
soft-punchthrough (SPT) insulated gate bipolar transistor (IGBT). The IGBT physical models …

A new lumped-charge modeling method for power semiconductor devices

Y Duan, F Iannuzzo, F Blaabjerg - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
This article proposes a new lumped-charge model for power semiconductor devices. The
existing lumped-charge model, due to its linear modeling method, has some limitations that …

A novel lumped-charge model for insulated gate bipolar transistor based on dynamic charge control

X Yang, Y Sun, Y Ding, G Liu - IEEE Transactions on Power …, 2023 - ieeexplore.ieee.org
The lumped-charge (LC) model of insulated-gate bipolar transistor (IGBT) provides an
effective and efficient way to study its characteristics. However, the quasi-static assumption …

Modeling of high-voltage nonpunch-through PIN diode snappy reverse recovery and its optimal suppression method based on RC snubber circuit

X Li, F **ao, Y Luo, R Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The snappy reverse recovery (SRR) and failure of high-voltage nonpunch-through (NPT)
PIN diodes under extreme working conditions are of great significance to the reliability …