Force measurements with the atomic force microscope: Technique, interpretation and applications
The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …
surfaces at high resolution. It can also be used to measure force-versus-distance curves …
Cantilever-like micromechanical sensors
The field of cantilever-based sensing emerged in the mid-1990s and is today a well-known
technology for label-free sensing which holds promise as a technique for cheap, portable …
technology for label-free sensing which holds promise as a technique for cheap, portable …
AFM–IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterization
Polymer and life science applications of a technique that combines atomic force microscopy
(AFM) and infrared (IR) spectroscopy to obtain nanoscale IR spectra and images are …
(AFM) and infrared (IR) spectroscopy to obtain nanoscale IR spectra and images are …
Theory of infrared nanospectroscopy by photothermal induced resonance
We present a theoretical investigation of the physics involved in a recently developed
spectromicroscopy technique, called photothermal induced resonance (PTIR). With this …
spectromicroscopy technique, called photothermal induced resonance (PTIR). With this …
Direct measurement of the forces between complementary strands of DNA
Interaction forces between single strands of DNA were measured with the atomic force
microscope by a procedure in which DNA oligonucleotides were covalently attached to a …
microscope by a procedure in which DNA oligonucleotides were covalently attached to a …
Measuring small longitudinal phase shifts: weak measurements or standard interferometry?
Recently, weak measurements were used to measure small effects that are transverse to the
propagation direction of a light beam. Here we address the question of whether weak …
propagation direction of a light beam. Here we address the question of whether weak …
Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
We have developed a low noise cantilever deflection sensor with a deflection noise density
of 17 fm∕ Hz by optimizing the parameters used in optical beam deflection (OBD) method …
of 17 fm∕ Hz by optimizing the parameters used in optical beam deflection (OBD) method …
Cantilever-based biosensors
C Ziegler - Analytical and bioanalytical chemistry, 2004 - Springer
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Optimizing the signal-to-noise ratio of a beam-deflection measurement with interferometric weak values
The amplification obtained using weak values is quantified through a detailed investigation
of the signal-to-noise ratio for an optical beam-deflection measurement. We show that for a …
of the signal-to-noise ratio for an optical beam-deflection measurement. We show that for a …
Ultrasensitive measurement of microcantilever displacement below the shot-noise limit
The displacement of micro-electro-mechanical-systems (MEMS) cantilevers is used to
measure a broad variety of phenomena in devices ranging from force microscopes to …
measure a broad variety of phenomena in devices ranging from force microscopes to …