Static secondary ion mass spectrometry (S‐SIMS) allows the chemical characterization of
the constituents in the upper monomolecular layer of a solid sample. Within the range of …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful chemical
characterization technique allowing for the distribution of all material components (including …

Multivariate image analysis (MIA) is a methodology for analyzing multivariate images, where
the image coordinates are position (two‐or three‐dimensions) and variable number …

This completely revised second edition of the standard work has been expanded by some
twenty percent to include more information on the latest developments and new apparatus …

We describe a new secondary ion mass spectrometry technique for compositional analysis
of matrix elements. It consists of detecting the molecular ions CsM+ rather than M±ions (M is …

An alkaline etched, superhydrophilic aluminum surface was modified using functionalized
alkyl compounds selected to study the effect of their properties on adsorption on the metal …

Ionization of neutral atoms sputtered from ion bombarded solids by multiphoton resonance
ionization has been demonstrated for the first time. The ionization efficiency is several orders …

Partition coefficients between olivine and melt at upper mantle conditions, 3 to 14 GPa, have
been determined for 27 trace elements (Li, Be, B, Na, Mg, Al, Si, P, K, Ca, Sc, Ti, V, Cr, Mn …

Modern analytical methods for the investigation of surfaces have been greatly improved
during the last decade, and the number of instruments offered by manufacturers has …

This tutorial discusses the predominant methods available for surface mass spectrometry
(MS) of molecular species: thermal desorption spectroscopy, laser desorption MS …