Combining obsolescence and temperature stress to evaluate the immunity of voltage regulators to direct power injection in long-lifespan systems

J Al Rashid, M Koohestani, R Perdriau… - IEEE Letters on …, 2023 - ieeexplore.ieee.org
This letter compares the electromagnetic compatibility (EMC) performance of three different
voltage regulator integrated circuits (ICs)(ie, UA78L05, L78L05, and MC78L05) developed …

[HTML][HTML] Lifetime reliability modeling on EMC performance of digital ICs influenced by the environmental and aging constraints: A case study

J Al Rashid, M Koohestani, L Saintis… - Microelectronics …, 2024 - Elsevier
This paper aims to develop the lifetime reliability model on electromagnetic compatibility
(EMC) performance of the Atmel Attiny85 microcontroller integrated circuit (IC) chip samples …

Degradation and Reliability Modeling of EM robustness of voltage regulators based on ADT: An approach and a case study

J Al Rashid, M Koohestani, L Saintis… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
This paper presents an approach to develop degradation and reliability models of analog
integrated circuit (IC) voltage regulators based on the long-term evolution of the …

High temperature accelerated ageing influence on the conducted immunity modelling of the commonly used voltage regulator ICs

J Al Rashid, M Koohestani, L Saintis… - 2023 International …, 2023 - ieeexplore.ieee.org
This paper aims to develop and compare the integrated circuit conducted immunity (ICIM-CI)
models of two different voltage regulator ICs with similar functionality (ie, UA78L05 and …

Life prediction of residual current circuit breaker with overcurrent protection based on Tweedie exponential dispersion process with random effects

G Liu, L Wang, Y Yang, D Liu, J Miao - Electrical Engineering, 2024 - Springer
The residual current circuit breaker with overcurrent protection (RCBO) is essential for
maintaining the safety and reliability of low voltage distribution systems. However, the …

Accelerated ageing effects on the EMC performance of LDO regulators under multi-stresses: Experimental study and prediction approach

H Liu, X Fan, X Hu, S Liu, J Wang - Microelectronics Reliability, 2023 - Elsevier
Low dropout voltage regulators (LDOs) play a crucial role in power management circuits.
Unfortunately, long-term instability may threaten their functionality as well as their EMC …

Degradation and Lifetime Reliability Models to Assess the Electromagnetic Compatibility Performance of Integrated Circuits Under Environmental Constraints

MJ Al Rashid - 2023 - theses.hal.science
The severe environmental conditions can have a significant effect on the electromagnetic
compatibility (EMC) performance of both analog and digital integrated circuits (IC). In …

[PDF][PDF] Definition of reliability qualification tests of electronic components for active implanted medical devices

A KOBI - sagip.org
Sujet de Stage Page 1 LARIS Laboratoire angevin de recherche en ingénierie des systèmes
Page 1/5 Definition of reliability qualification tests of electronic components for active implanted …