Scanning magnetic microscope having improved magnetic sensor
G **ao - US Patent 7,145,330, 2006 - Google Patents
(57) ABSTRACT A scanning magnetic microscope SMM (20) includes a sensor (10) for
sensing a magnetic field generated by a specimen (78), the sensor including one of a MTJ, a …
sensing a magnetic field generated by a specimen (78), the sensor including one of a MTJ, a …
Differential waveguide probe
RL Campbell, M Andrews - US Patent 7,876,114, 2011 - Google Patents
US7876114B2 - Differential waveguide probe - Google Patents US7876114B2 - Differential
waveguide probe - Google Patents Differential waveguide probe Download PDF Info …
waveguide probe - Google Patents Differential waveguide probe Download PDF Info …
Probe head having a membrane suspended probe
K Smith, M Jolley, V Van Syckel - US Patent 7,368,927, 2008 - Google Patents
A probe head including an elastic membrane capable of exerting a restoring force when one
of the surfaces of the elastic membrane is distorted. A conductive probe includes a beam …
of the surfaces of the elastic membrane is distorted. A conductive probe includes a beam …
Integrated multi-axis hybrid magnetic field sensor
M Lagouge - US Patent App. 12/730,717, 2011 - Google Patents
Inventor: Matthieu Lagouge, Wuxi (CN) A multi-axis magnetic field sensing device combines
two magnetoresistive sensors to measure the two orthogonal com (21) Appl. No …
two magnetoresistive sensors to measure the two orthogonal com (21) Appl. No …
Active wafer probe
E Strid, KR Gleason - US Patent 7,427,868, 2008 - Google Patents
(57) ABSTRACT A probe suitable for probing a semiconductor wafer that includes an active
circuit. The probe may have a rigid probing member and include a flexible interconnection …
circuit. The probe may have a rigid probing member and include a flexible interconnection …
System for testing semiconductors
P Andrews, D Hess - US Patent 7,656,172, 2010 - Google Patents
US7656172B2 - System for testing semiconductors - Google Patents US7656172B2 -
System for testing semiconductors - Google Patents System for testing semiconductors …
System for testing semiconductors - Google Patents System for testing semiconductors …
Probe for testing a device under test
KR Gleason, T Lesher, EW Strid, M Andrews… - US Patent …, 2007 - Google Patents
US7161363B2 - Probe for testing a device under test - Google Patents US7161363B2 -
Probe for testing a device under test - Google Patents Probe for testing a device under test …
Probe for testing a device under test - Google Patents Probe for testing a device under test …
Shielded probe for testing a device under test
KR Gleason, T Lesher, M Andrews, J Martin - US Patent 7,271,603, 2007 - Google Patents
A probe measurement system for measuring the electrical characteristics of integrated
circuits or other microelectronic devices at high frequencies. The probe measurement …
circuits or other microelectronic devices at high frequencies. The probe measurement …
Wafer probe
L Hayden, J Martin, M Andrews - US Patent 7,233,160, 2007 - Google Patents
US7233160B2 - Wafer probe - Google Patents US7233160B2 - Wafer probe - Google Patents
Wafer probe Download PDF Info Publication number US7233160B2 US7233160B2 …
Wafer probe Download PDF Info Publication number US7233160B2 US7233160B2 …
Method of constructing a membrane probe
R Gleason, MA Bayne, K Smith - US Patent 7,533,462, 2009 - Google Patents
2,142,625 2,376,101 2,389,668 3,176,091 3,193,712 3,230,299 3,401,126 3.429, 040
3,441,315 3,442,831 3.445, 770 3,484,679 3,541.222 3,595,228 3,596,228 3,609,539 …
3,441,315 3,442,831 3.445, 770 3,484,679 3,541.222 3,595,228 3,596,228 3,609,539 …