A review of speckle pattern fabrication and assessment for digital image correlation

YL Dong, B Pan - Experimental Mechanics, 2017 - Springer
As a carrier of deformation information, the speckle pattern, or more exactly the random
intensity distributions, which could be naturally occurred or artificially fabricated onto test …

Effect of aging on the high strain rate mechanical properties of SAC105 and SAC305 leadfree alloys

P Lall, S Shantaram, J Suhling… - 2013 IEEE 63rd …, 2013 - ieeexplore.ieee.org
Electronics subjected to shock and vibration may experience strain rates of 1-100 sec-1.
High strain rate data is scarce for leadfree solders at strain rates in the range of 1-100 sec-1 …

High speed digital image correlation for transient-shock reliability of electronics

P Lall, D Panchagade, D Iyengar… - 2007 Proceedings …, 2007 - ieeexplore.ieee.org
Electronics may be subjected to shock, vibration, and drop-impact during ship**, handling
and during normal usage. Measurement of transient dynamic deformation of the electronics …

Explicit submodeling and digital image correlation based life-prediction of leadfree electronics under shock-impact

P Lall, S Shantaram, A Angral… - 2009 59th Electronic …, 2009 - ieeexplore.ieee.org
Relative damage-index based on the leadfree interconnect transient strain history from
digital image correlation, explicit finite-elements, cohesive-zone elements, and component's …

Design envelopes and optical feature extraction techniques for survivability of SnAg leadfree packaging architectures under shock and vibration

P Lall, D Iyengar, S Shantaram… - 2008 58th Electronic …, 2008 - ieeexplore.ieee.org
In this paper, a design-envelope approach based on optical feature extraction techniques
has been investigated for drop and shock survivability of electronic packaging has been …

Direct error in constitutive equation formulation for plane stress inverse elasticity problem

OA Babaniyi, AA Oberai, PE Barbone - Computer methods in applied …, 2017 - Elsevier
We present a new computational formulation for inverse problems in elasticity with full field
data. The formulation is a variant of an error in the constitutive equation formulation, but …

Peridynamic-models using finite elements for shock and vibration reliability of leadfree electronics

P Lall, S Shantaram… - 2010 12th IEEE …, 2010 - ieeexplore.ieee.org
Electronic packages subjected to drop and shock have been simulated using alternative
theory known as peridynamic theory in the realm of FEM. In peridynamics, problems are …

Mechanical deformation behavior of SAC305 at high strain rates

P Lall, S Shantaram, J Suhling… - … Conference on Thermal …, 2012 - ieeexplore.ieee.org
Electronic products are subjected to high G-levels during mechanical shock and vibration.
Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace …

X-ray micro-CT and digital-volume correlation based three-dimensional measurements of deformation and strain in operational electronics

P Lall, J Wei - 2015 IEEE 65th Electronic Components and …, 2015 - ieeexplore.ieee.org
Electronic components may be subjected to significant deformation under the action of
thermal and mechanical loads during operation and storage. The use of thin material layers …

Modeling and reliability characterization of area-array electronics subjected to high-g mechanical shock up to 50,000 g

P Lall, K Patel, R Lowe, M Strickland… - 2012 IEEE 62nd …, 2012 - ieeexplore.ieee.org
Electronics in aerospace applications may be subjected to very high g-loads during normal
operation. A novel micro-coil array interconnect has been studied for increased reliability …